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Technical Specifications
Parameters and characteristics for this part
| Specification | SN74ACT8997DWR |
|---|---|
| Logic Type | SCAN-PATH LINKERS |
| Mounting Type | Surface Mount |
| Number of Bits | 4 |
| Operating Temperature [Max] | 70 °C |
| Operating Temperature [Min] | 0 °C |
| Package / Case | 28-SOIC |
| Package / Case [x] | 0.295 in |
| Package / Case [y] | 7.5 mm |
| Supplier Device Package | 28-SOIC |
| Supply Voltage [Max] | 5.5 V |
| Supply Voltage [Min] | 4.5 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
Description
General part information
SN74ACT8997 Series
The 'ACT8997 are members of the Texas Instruments SCOPETMtestability integrated-circuit family. This family of components facilitates testing of complex circuit-board assemblies.
The 'ACT8997 enhance the scan capability of TI's SCOPETMfamily by allowing augmentation of a system's primary scan path with secondary scan paths (SSPs), which can be individually selected by the 'ACT8997 for inclusion in the primary scan path. These devices also provide buffering of test signals to reduce the need for external logic.
By loading the proper values into the instruction register and data registers, the user can select up to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any of the device's six data registers or the instruction register can be placed in the device's scan path, i.e., placed between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.
Documents
Technical documentation and resources
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