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MAX5316EVKIT#
Development Boards, Kits, Programmers

MAX5316EVKIT#

Obsolete
Analog Devices Inc./Maxim Integrated

EVAL KIT MAX5316 (16-BIT, A 1 LS

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MAX5316EVKIT#
Development Boards, Kits, Programmers

MAX5316EVKIT#

Obsolete
Analog Devices Inc./Maxim Integrated

EVAL KIT MAX5316 (16-BIT, A 1 LS

Deep-Dive with AI

Technical Specifications

Parameters and characteristics for this part

SpecificationMAX5316EVKIT#
ContentsBoard(s)
DAC TypeVoltage
Data InterfaceSPI
Number of Bits16
Number of DAC's1
Settling Time3 µs
Supplied ContentsBoard(s)
Utilized IC / PartMAX5316

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyN/A 0$ 123.53

Description

General part information

MAX5316 Series

The MAX5316 is a high-accuracy, 16-bit, serial SPI input, buffered voltage output digital-to-analog converter (DAC) in a 4mm x 5mm, 24-lead TQFN package. The device features ±1 LSB INL (max) accuracy and a ±0.25 LSB DNL (typ) accuracy over the temperature range of -40°C to +105°C.The DAC voltage output is buffered with a fast settling time of 3µs and a low offset and gain drift of ±0.6ppm/°C of FSR (typ). The force-sense output (OUT) maintains accuracy while driving loads with long lead lengths. A separate AVSS supply is provided to permit the output amplifier to go to 0V (GND) to maintain full linearity performance near ground.At power-up, the device resets its outputs to zero or midscale.The wide 2.7V to 5.5V supply voltage range and integrated low-drift, low-noise reference buffer make for ease of use. The MAX5316 features a 50MHz 3-wire SPI interface. For an I²C interface, use the MAX5317.The MAX5316 is available in a 24-lead TQFN-EP package and operates over the -40°C to +105°C temperature range.ApplicationsAutomatic CalibrationAutomatic Test EquipmentCommunication SystemsData-Acquisition SystemsGain and Offset AdjustmentMedical EquipmentProcess Control and Servo LoopsProgrammable Voltage and Current SourcesTest and Measurement

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