Test and Measurement

TOP125I40/200G

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125MIL ICT PROBE

Test and Measurement

Active

125MIL ICT PROBE

Technical Specifications

Parameters and characteristics for this part

Part	Tip Plating	Material - Tip	Length - Tip	Material - Body	Current Rating	Operating Temperature (Min)	Operating Temperature (Max)	Length - Overall	Tip Type	Tip Diameter
Chip Shine / CSRF TOP125I40/200G	Gold Plated	Beryllium Copper Steel	0.329 in	Gold Plated Phosphor Copper	3 A	-55 °C	120 °C	1.3 in	Spring Tip - Serrated Head	0.157 in
Chip Shine / CSRF TOP125E25/250G	Gold Plated	Beryllium Copper Steel	0.329 in	Gold Plated Phosphor Copper	3 A	-55 °C	120 °C	1.3 in	Spring Tip - Cup Head	0.098 in
Chip Shine / CSRF TOP125C17/400G	Gold Plated	Beryllium Copper Steel	0.329 in	Gold Plated Phosphor Copper	3 A	-55 °C	120 °C	1.3 in	Spring Tip - Spherical Head	0.067 in

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$	Updated

Digikey	Box	100	$ 2.00	<4d

3D models and CAD resources for this part

General part information

3 A Spring Tip - Serrated Head, 0.157" (4.00mm) Dia

Technical documentation and resources