
SN74HCS20-Q1 Series
Automotive dual 4-input NAND gates with Schmitt-trigger inputs
Manufacturer: Texas Instruments
Catalog
Automotive dual 4-input NAND gates with Schmitt-trigger inputs
Key Features
• AEC-Q100 Qualified for automotive applications:Device temperature grade 1: –40°C to +125°C, TADevice HBM ESD Classification Level 2Device CDM ESD Classifcation Level C6Wide operating voltage range: 2 V to 6 VSchmitt-trigger inputs allow for slow or noisy input signalsLow power consumptionTypical ICCof 100 nATypical input leakage current of ±100 nA±7.8-mA output drive at 5 VAEC-Q100 Qualified for automotive applications:Device temperature grade 1: –40°C to +125°C, TADevice HBM ESD Classification Level 2Device CDM ESD Classifcation Level C6Wide operating voltage range: 2 V to 6 VSchmitt-trigger inputs allow for slow or noisy input signalsLow power consumptionTypical ICCof 100 nATypical input leakage current of ±100 nA±7.8-mA output drive at 5 V
Description
AI
This device contains two independent 4-input NAND gates with Schmitt-trigger inputs. Each gate performs the Boolean function Y =A ● B ● C ● Din positive logic.
This device contains two independent 4-input NAND gates with Schmitt-trigger inputs. Each gate performs the Boolean function Y =A ● B ● C ● Din positive logic.