Catalog
Dual USB port transient suppressor
Key Features
• Design to protect submicron 3-V or 5-V circuits from noise transientsPort ESD protection capability exceeds:15-kV human body model2-kV machine modelAvailable in a WCSP chip-scale packageStand-off voltage: 6 V (minimum)Low current leakage: 1-µA maximum at 6 VLow capacitance: 35-pF (typical)Design to protect submicron 3-V or 5-V circuits from noise transientsPort ESD protection capability exceeds:15-kV human body model2-kV machine modelAvailable in a WCSP chip-scale packageStand-off voltage: 6 V (minimum)Low current leakage: 1-µA maximum at 6 VLow capacitance: 35-pF (typical)
Description
AI
The SN65220 device is a dual, and the SN65240 and SN75240 devices are quadruple, unidirectional transient voltage suppressors (TVS). These devices provide electrical noise transient protection to Universal Serial Bus (USB) low and full-speed ports. The input capacitance of 35 pF makes it unsuitable for high-speed USB 2.0 applications.
Any cabled I/O can be subjected to electrical noise transients from various sources. These noise transients can cause damage to the USB transceiver or the USB ASIC if they are of sufficient magnitude and duration.
The SN65220, SN65240, and SN75240 devices ESD performance is measured at the system level, according to IEC61000-4-2; system design, however, impacts the results of these tests. To accomplish a high compliance level, careful board design and layout techniques are required.
The SN65220 device is a dual, and the SN65240 and SN75240 devices are quadruple, unidirectional transient voltage suppressors (TVS). These devices provide electrical noise transient protection to Universal Serial Bus (USB) low and full-speed ports. The input capacitance of 35 pF makes it unsuitable for high-speed USB 2.0 applications.
Any cabled I/O can be subjected to electrical noise transients from various sources. These noise transients can cause damage to the USB transceiver or the USB ASIC if they are of sufficient magnitude and duration.
The SN65220, SN65240, and SN75240 devices ESD performance is measured at the system level, according to IEC61000-4-2; system design, however, impacts the results of these tests. To accomplish a high compliance level, careful board design and layout techniques are required.
