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ISOS141-SEP

ISOS141-SEP Series

Radiation tolerant quad-channel, 3/1 digital isolator in space enhanced plastic

Manufacturer: Texas Instruments

Catalog

Radiation tolerant quad-channel, 3/1 digital isolator in space enhanced plastic

Key Features

Radiation TolerantTotal Ionizing Dose (TID) Characterized (ELDRS-Free) = 30 krad(Si)TID RLAT/RHA = 30 krad(Si)Single-Event Latch-up (SEL) Immune to LET = 43 MeV⋅cm2/mg at 125°CSingle-Event Dielectric Rupture (SEDR) Immune (43 MeV⋅cm2/mg) at 500 VDCSpace Enhanced Plastic (Space EP)Meets NASA’s ASTM E595 Outgassing SpecVendor Item Drawing (VID)V62/21610Military Temp Range (-55°C to 125°C)One Wafer Fabrication SiteOne Assembly and Test SiteGold Bond Wire, NiPdAu Lead FinishWafer Lot TraceabilityExtended Product Life CycleExtended Product Change Notification600 VRMScontinous working voltageSection 6.7:DIN VDE V 0884-11:2017-01UL 1577 component recognition program100 Mbps data rateWide supply range: 2.25 V to 5.5 V2.25-V to 5.5-V level translationDefault outputlowLow power consumption, 1.5 mA per channel typical at 1 MbpsLow propagation delay: 10.7 ns typical (5-V Supplies)Low channel-to-channel skew: 4 ns max (5-V Supplies)±100 kV/µs typical CMTISystem-level ESD, EFT, Surge, and Magnetic ImmunitySmall QSOP (DBQ-16) packageRadiation TolerantTotal Ionizing Dose (TID) Characterized (ELDRS-Free) = 30 krad(Si)TID RLAT/RHA = 30 krad(Si)Single-Event Latch-up (SEL) Immune to LET = 43 MeV⋅cm2/mg at 125°CSingle-Event Dielectric Rupture (SEDR) Immune (43 MeV⋅cm2/mg) at 500 VDCSpace Enhanced Plastic (Space EP)Meets NASA’s ASTM E595 Outgassing SpecVendor Item Drawing (VID)V62/21610Military Temp Range (-55°C to 125°C)One Wafer Fabrication SiteOne Assembly and Test SiteGold Bond Wire, NiPdAu Lead FinishWafer Lot TraceabilityExtended Product Life CycleExtended Product Change Notification600 VRMScontinous working voltageSection 6.7:DIN VDE V 0884-11:2017-01UL 1577 component recognition program100 Mbps data rateWide supply range: 2.25 V to 5.5 V2.25-V to 5.5-V level translationDefault outputlowLow power consumption, 1.5 mA per channel typical at 1 MbpsLow propagation delay: 10.7 ns typical (5-V Supplies)Low channel-to-channel skew: 4 ns max (5-V Supplies)±100 kV/µs typical CMTISystem-level ESD, EFT, Surge, and Magnetic ImmunitySmall QSOP (DBQ-16) package

Description

AI
The ISOS141-SEP radiation-tolerant device is a high-performance, quad-channel digital isolator in a small form factor 16-pin QSOP package. Each isolation channel has a logic input and output buffer separated by a double capacitive silicon dioxide (SiO2) insulation barrier. This device supports low Earth orbit (LEO) space applications with its high data rate of 100 Mbps, low propagation delay of 10.7 ns, and tight channel-to-channel skew of 4 ns. The ISOS141-SEP device has three forward and one reverse-direction channels and if the input power or signal is lost, the default output is low. The enable pins can be used to put the respective outputs in high impedance for multi-master driving applications and to reduce power consumption. The ISOS141-SEP provides high electromagnetic immunity and low emissions with low power consumption, while isolating CMOS or LVCMOS digital I/Os. The device has a high common-mode transient immunity of 100 kV/µs and can ease system-level ESD, EFT, surge, and simplify emissions compliance through its innovative chip design. The ISOS141-SEP radiation-tolerant device is a high-performance, quad-channel digital isolator in a small form factor 16-pin QSOP package. Each isolation channel has a logic input and output buffer separated by a double capacitive silicon dioxide (SiO2) insulation barrier. This device supports low Earth orbit (LEO) space applications with its high data rate of 100 Mbps, low propagation delay of 10.7 ns, and tight channel-to-channel skew of 4 ns. The ISOS141-SEP device has three forward and one reverse-direction channels and if the input power or signal is lost, the default output is low. The enable pins can be used to put the respective outputs in high impedance for multi-master driving applications and to reduce power consumption. The ISOS141-SEP provides high electromagnetic immunity and low emissions with low power consumption, while isolating CMOS or LVCMOS digital I/Os. The device has a high common-mode transient immunity of 100 kV/µs and can ease system-level ESD, EFT, surge, and simplify emissions compliance through its innovative chip design.