SN74AUP1G74 Series

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

Catalog

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

Part	Function	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Clock Frequency	Max Propagation Delay @ V, Max CL	Input Capacitance	Output Type	Package / Case [y]	Package / Case	Package / Case [y]	Voltage - Supply [Min]	Voltage - Supply [Max]	Number of Elements	Mounting Type	Operating Temperature [Max]	Operating Temperature [Min]	Type	Trigger Type	Number of Bits per Element	Supplier Device Package
Texas Instruments SN74AUP1G74DCUR	Reset Set(Preset)	4 mA	4 mA	100 MHz	7 ns	1.5 pF	Complementary	2.3 mm	8-VFSOP	0.091 in	0.8 V	3.6 V	1	Surface Mount	85 C	-40 °C	D-Type	Positive Edge	1
Texas Instruments SN74AUP1G74RSER	Reset Set(Preset)	4 mA	4 mA	100 MHz	7 ns	1.5 pF	Complementary		8-UFQFN		0.8 V	3.6 V	1	Surface Mount	85 °C	-40 °C	D-Type	Positive Edge	1	8-UQFN (1.5x1.5)
Texas Instruments SN74AUP1G74DQER	Reset Set(Preset)	4 mA	4 mA	100 MHz	7 ns	1.5 pF	Complementary		8-XFDFN		0.8 V	3.6 V	1	Surface Mount	85 °C	-40 °C	D-Type	Positive Edge	1	8-X2SON (1.4x1)
Texas Instruments SN74AUP1G74YFPR	Reset Set(Preset)	4 mA	4 mA	100 MHz	7 ns	1.5 pF	Complementary		8-XFBGA DSBGA		0.8 V	3.6 V	1	Surface Mount	85 °C	-40 °C	D-Type	Positive Edge	1	8-DSBGA

Catalog

Low-Power Single Positive-Edge-Triggered D-Type Flip-Flop

Key Features

• Available in the Texas Instruments NanoStar PackageLow Static-Power Consumption: ICC= 0.9 μA MaximumLow Dynamic-Power Consumption: Cpd= 5.5 pF Typical at 3.3 VLow Input Capacitance: Ci= 1.5 pF TypicalLow Noise – Overshoot and Undershoot < 10% of VCCIoffSupports Partial-Power-Down Mode OperationSchmitt-Trigger Action Allows Slow Input Transition and Better Switching Noise Immunity at the Input (Vhys= 250 mV Typical at 3.3 V)Wide Operating VCCRange of 0.8 V to 3.6 VOptimized for 3.3-V Operation3.6-V I/O Tolerant to Support Mixed-Mode Signal Operationtpd= 5 ns Maximum at 3.3 VSuitable for Point-to-Point ApplicationsLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Performance Tested Per JESD 222000-V Human-Body Model (A114-B, Class II)1000-V Charged-Device Model (C101)NanoStar Is a trademark of Texas Instruments. All other trademarks are the property of their respective ownersAPPLICATIONSServersLED DisplaysNetwork SwitchesTelecom InfrastructureMotor DriversI/O ExpandersAvailable in the Texas Instruments NanoStar PackageLow Static-Power Consumption: ICC= 0.9 μA MaximumLow Dynamic-Power Consumption: Cpd= 5.5 pF Typical at 3.3 VLow Input Capacitance: Ci= 1.5 pF TypicalLow Noise – Overshoot and Undershoot < 10% of VCCIoffSupports Partial-Power-Down Mode OperationSchmitt-Trigger Action Allows Slow Input Transition and Better Switching Noise Immunity at the Input (Vhys= 250 mV Typical at 3.3 V)Wide Operating VCCRange of 0.8 V to 3.6 VOptimized for 3.3-V Operation3.6-V I/O Tolerant to Support Mixed-Mode Signal Operationtpd= 5 ns Maximum at 3.3 VSuitable for Point-to-Point ApplicationsLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Performance Tested Per JESD 222000-V Human-Body Model (A114-B, Class II)1000-V Charged-Device Model (C101)NanoStar Is a trademark of Texas Instruments. All other trademarks are the property of their respective ownersAPPLICATIONSServersLED DisplaysNetwork SwitchesTelecom InfrastructureMotor DriversI/O Expanders

Description

The AUP family is TI's premier solution to the industry's low-power needs in battery-powered portable applications. This family ensures a very low static- and dynamic-power consumption across the entire VCCrange of 0.8 V to 3.6 V, resulting in increased battery life. This product also maintains excellent signal integrity (see the very low undershoot and overshoot characteristics shown in ). The AUP family is TI's premier solution to the industry's low-power needs in battery-powered portable applications. This family ensures a very low static- and dynamic-power consumption across the entire VCCrange of 0.8 V to 3.6 V, resulting in increased battery life. This product also maintains excellent signal integrity (see the very low undershoot and overshoot characteristics shown in ).