SN74AUC1G125-EP Series

Enhanced product single 0.8-V to 2.7-V high speed buffer with 3-state outputs

Catalog

Enhanced product single 0.8-V to 2.7-V high speed buffer with 3-state outputs

Part	Package / Case	Number of Elements	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Supplier Device Package	Number of Bits per Element	Mounting Type	Output Type	Voltage - Supply [Max]	Voltage - Supply [Min]	Logic Type	Operating Temperature [Max]	Operating Temperature [Min]
Texas Instruments CAUC1G125MDCKREP	5-TSSOP SC-70-5 SOT-353	1	9 mA	9 mA	SC-70-5	1	Surface Mount	3-State	2.7 V	0.8 V	Buffer Non-Inverting	125 °C	-55 °C

Catalog

Enhanced product single 0.8-V to 2.7-V high speed buffer with 3-state outputs

Key Features

• Controlled BaselineOne Assembly SiteOne Test SiteOne Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Optimized for 1.8-V Operation and Is 3.6-V I/O Tolerant to Support Mixed-Mode Signal OperationIoffSupports Partial-Power-Down Mode OperationSub-1-V OperableMax tpdof 2.5 ns at 1.8 VLow Power Consumption, 10-µA Max ICC±8-mA Output Drive at 1.8 VLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly SiteOne Test SiteOne Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Optimized for 1.8-V Operation and Is 3.6-V I/O Tolerant to Support Mixed-Mode Signal OperationIoffSupports Partial-Power-Down Mode OperationSub-1-V OperableMax tpdof 2.5 ns at 1.8 VLow Power Consumption, 10-µA Max ICC±8-mA Output Drive at 1.8 VLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The SN74AUC1G125 is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V to 1.95-V VCCoperation. The SN74AUC1G125 is a single-line driver with a 3-state output. The output is disabled when the output-enable (OE) input is high. To ensure the high-impedance state during power up or power down,OEshould be tied to VCCthrough a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. The SN74AUC1G125 is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V to 1.95-V VCCoperation. The SN74AUC1G125 is a single-line driver with a 3-state output. The output is disabled when the output-enable (OE) input is high. To ensure the high-impedance state during power up or power down,OEshould be tied to VCCthrough a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.