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SN74AHC1G02-EP

SN74AHC1G02-EP Series

Enhanced product single 2-input, 2-V to 5.5-V NOR gate

Manufacturer: Texas Instruments

Catalog

Enhanced product single 2-input, 2-V to 5.5-V NOR gate

Key Features

Controlled BaselineOne Assembly SiteOne Test SiteOne Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Operating Range of 2 V to 5.5 VMax tpdof 8.5 ns at 5 VLow Power Consumption, 10 µA Max ICC±8 mA Output Drive at 5 VSchmitt Trigger Action at All Inputs Makes the Circuit Tolerant for Slower Input Rise and Fall TimeESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly SiteOne Test SiteOne Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Operating Range of 2 V to 5.5 VMax tpdof 8.5 ns at 5 VLow Power Consumption, 10 µA Max ICC±8 mA Output Drive at 5 VSchmitt Trigger Action at All Inputs Makes the Circuit Tolerant for Slower Input Rise and Fall TimeESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

AI
This device contains a single 2-input NOR gate that performs the Boolean function Y = A × B or Y = A + B in positive logic. This device contains a single 2-input NOR gate that performs the Boolean function Y = A × B or Y = A + B in positive logic.