SN74AHCT08Q-Q1 Series

4-ch, 2-input 4.5-V to 5.5-V high-speed (7.1 ns) AND gate with TTL-compatible inputs

Catalog

4-ch, 2-input 4.5-V to 5.5-V high-speed (7.1 ns) AND gate with TTL-compatible inputs

Part	Operating Temperature [Min]	Operating Temperature [Max]	Number of Inputs	Mounting Type	Input Logic Level - Low	Voltage - Supply [Min]	Voltage - Supply [Max]	Logic Type	Number of Circuits	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Package / Case	Package / Case [y]	Package / Case [x]	Max Propagation Delay @ V, Max CL	Supplier Device Package	Package / Case [custom]	Package / Case [custom]	Qualification	Grade
Texas Instruments SN74AHCT08N	-40 °C	125 °C	2	Through Hole	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-DIP	7.62 mm	0.3 "	7.9 ns
Texas Instruments SN74AHCT08BQAR	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-WFQFN Exposed Pad			7.9 ns	14-WQFN (3x2.5)
Texas Instruments SN74AHCT08PWRG4	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-TSSOP			7.9 ns	14-TSSOP	0.173 "	4.4 mm
Texas Instruments SN74AHCT08QDRG4Q1	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-SOIC	3.9 mm	0.154 in	7.9 ns				AEC-Q100	Automotive
Texas Instruments SN74AHCT08RGYR	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-VFQFN Exposed Pad			7.9 ns	14-VQFN (3.5x3.5)
Texas Instruments SN74AHCT08D	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-SOIC	3.9 mm	0.154 in	7.9 ns
Texas Instruments SN74AHCT08QPWRQ1	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-TSSOP			7.9 ns	14-TSSOP	0.173 "	4.4 mm	AEC-Q100	Automotive
Texas Instruments SN74AHCT08QDRQ1	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-SOIC	3.9 mm	0.154 in	7.9 ns				AEC-Q100	Automotive
Texas Instruments SN74AHCT08QWBQARQ1	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-WFQFN Exposed Pad			7.9 ns	14-WQFN (3x2.5)			AEC-Q100	Automotive
Texas Instruments SN74AHCT08DE4	-40 °C	125 °C	2	Surface Mount	0.8 V	4.5 V	5.5 V	AND Gate	4	8 mA	8 mA	14-SOIC	3.9 mm	0.154 in	7.9 ns

Catalog

4-ch, 2-input 4.5-V to 5.5-V high-speed (7.1 ns) AND gate with TTL-compatible inputs

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessInputs Are TTL-Voltage CompatibleLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.EPIC is a trademark of Texas Instruments.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessInputs Are TTL-Voltage CompatibleLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.EPIC is a trademark of Texas Instruments.

Description

The SN74AHCT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic. The SN74AHCT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic.