DAC39RF10-SEP Series

Radiation-tolerant, 30-krad, 16-bit, two-channel 10.4-GSPS, 12-GHz RF digital-to-analog converter

Catalog

Radiation-tolerant, 30-krad, 16-bit, two-channel 10.4-GSPS, 12-GHz RF digital-to-analog converter

Part	Reference Type	Output Type	Voltage - Supply, Digital [Max]	Voltage - Supply, Digital [Min]	Architecture	Mounting Type	Operating Temperature [Min]	Operating Temperature [Max]	Differential Output	Data Interface	Voltage - Supply, Analog [Max]	Voltage - Supply, Analog [Min]	Number of Bits	Package / Case	Supplier Device Package	INL/DNL (LSB)
Texas Instruments DAC39RF10ACLNSP	External Internal	Current - Unbuffered	1.05 V	0.95 V	Current Source	Surface Mount	-55 °C	125 °C		JESD204B	1.05 V 1.89 V	0.95 V 1.71 V	16	256-BBGA FCBGA	256-FCBGA (17x17)	2.2 LSB 9 LSB

Catalog

Radiation-tolerant, 30-krad, 16-bit, two-channel 10.4-GSPS, 12-GHz RF digital-to-analog converter

Key Features

• Radiation hardness assured DAC39RFx10-SP:Single event upset (SEU) immune registersSingle-event latch up (SEL): 120MeV-cm2/mgRLAT Total ionizing dose (TID): 300krad (Si)Radiation tolerant DAC39RFx10-SEP:Single event upset (SEU) immune registersSingle-event latch up (SEL): 43MeV-cm2/mgRLAT Total ionizing dose (TID): 30krad (Si)16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC CoresMaximum input data rate:8-bit, Single channel, DES mode: 20.8GSPS12-bit, Single channel, DES mode: 15.5GSPS16-bit, Single channel: 10.4GSPS8-bit, Dual channel, 10.4GSPS12-bit, Dual channel: 7.75GSPS/ch16-bit, Dual channel: 6.2GSPS/chOutput bandwidth (-3dB): 12GHzPerformance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither offNoise floor (small signal): –155dBFS/HzSFDR (-0.1dBFS) : 60dBcIMD3 (-7dBFS each tone) : –62dBcAdditive phase noise, 10kHz offset: -138dBc/HzFour Integrated digital up-converters (DUC)Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256xComplex baseband DUC for I/Q outputComplex to real up conversion for dual channel direct RF sampling64-bit frequency resolution NCOsJESD204C InterfaceUp to 16 Lanes at up to 12.8GbpsClass C-S, subclass-1 CompatibleInternal AC coupling capacitorsSYSREF Windowing for automatic SYSREF timing calibrationSpace screening and assurance:Meets ASTM E595 outgassing specificationOne fabrication, assembly, and test siteWafer lot traceabilityExtended product life cycleRadiation lot acceptance test (RLAT)Production burn-in (DAC39RFx10-SP only)Radiation hardness assured DAC39RFx10-SP:Single event upset (SEU) immune registersSingle-event latch up (SEL): 120MeV-cm2/mgRLAT Total ionizing dose (TID): 300krad (Si)Radiation tolerant DAC39RFx10-SEP:Single event upset (SEU) immune registersSingle-event latch up (SEL): 43MeV-cm2/mgRLAT Total ionizing dose (TID): 30krad (Si)16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC CoresMaximum input data rate:8-bit, Single channel, DES mode: 20.8GSPS12-bit, Single channel, DES mode: 15.5GSPS16-bit, Single channel: 10.4GSPS8-bit, Dual channel, 10.4GSPS12-bit, Dual channel: 7.75GSPS/ch16-bit, Dual channel: 6.2GSPS/chOutput bandwidth (-3dB): 12GHzPerformance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither offNoise floor (small signal): –155dBFS/HzSFDR (-0.1dBFS) : 60dBcIMD3 (-7dBFS each tone) : –62dBcAdditive phase noise, 10kHz offset: -138dBc/HzFour Integrated digital up-converters (DUC)Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256xComplex baseband DUC for I/Q outputComplex to real up conversion for dual channel direct RF sampling64-bit frequency resolution NCOsJESD204C InterfaceUp to 16 Lanes at up to 12.8GbpsClass C-S, subclass-1 CompatibleInternal AC coupling capacitorsSYSREF Windowing for automatic SYSREF timing calibrationSpace screening and assurance:Meets ASTM E595 outgassing specificationOne fabrication, assembly, and test siteWafer lot traceabilityExtended product life cycleRadiation lot acceptance test (RLAT)Production burn-in (DAC39RFx10-SP only)

Description

The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band. The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS). A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF. The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band. The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS). A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.