SN74LVC132A-Q1 Series
Automotive quadruple positive-NAND gates with Schmitt-trigger inputs
Manufacturer: Texas Instruments
Catalog
Automotive quadruple positive-NAND gates with Schmitt-trigger inputs
Key Features
• AEC-Q100 qualified for automotive applications:Device temperature grade 1: -40°C to +125°CDevice HBM ESD classification level 2Device CDM ESD classification level C4BAvailable in wettable flank QFN (WBQA) packageOperating range from 1.1V to 3.6V5.5V tolerant input pinsSupports standard pinoutsLatch-up performance exceeds 250mAper JESD 17ESD protection exceeds JESD 222000V Human-Body Model (A114-A)1000V Charged-Device Model (C101)AEC-Q100 qualified for automotive applications:Device temperature grade 1: -40°C to +125°CDevice HBM ESD classification level 2Device CDM ESD classification level C4BAvailable in wettable flank QFN (WBQA) packageOperating range from 1.1V to 3.6V5.5V tolerant input pinsSupports standard pinoutsLatch-up performance exceeds 250mAper JESD 17ESD protection exceeds JESD 222000V Human-Body Model (A114-A)1000V Charged-Device Model (C101)
Description
AI
The SN74LVC132A-Q1 device is a quadruple positive-NAND gate with Schmitt-trigger inputs for added noise immunity and support for slow input signal transitions. Each gate performs the Boolean function Y = A × B or Y = A + B in positive logic.
The SN74LVC132A-Q1 device is a quadruple positive-NAND gate with Schmitt-trigger inputs for added noise immunity and support for slow input signal transitions. Each gate performs the Boolean function Y = A × B or Y = A + B in positive logic.
