SN74HC08-Q1 Series

Enhanced product, 4-ch, 2-input 2-V to 6-V 5.2-mA drive strength AND gate

Catalog

Enhanced product, 4-ch, 2-input 2-V to 6-V 5.2-mA drive strength AND gate

Part	Input Logic Level - High [Min]	Input Logic Level - High [Max]	Number of Circuits	Package / Case [custom]	Package / Case [custom]	Package / Case	Operating Temperature [Max]	Operating Temperature [Min]	Grade	Input Logic Level - Low [Max]	Input Logic Level - Low [Min]	Supplier Device Package	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Number of Inputs	Qualification	Voltage - Supply [Min]	Voltage - Supply [Max]	Logic Type	Max Propagation Delay @ V, Max CL	Mounting Type	Package / Case [x]	Package / Case [y]	Package / Case	Package / Case
Texas Instruments SN74HC08IPWRQ1	1.5 V	4.2 V	4	0.173 "	4.4 mm	14-TSSOP	85 °C	-40 °C	Automotive	1.8 V	0.5 V	14-TSSOP	5.2 mA	5.2 mA	2	AEC-Q100	2 V	6 V	AND Gate	17 ns	Surface Mount
Texas Instruments SN74HC08DT	1.5 V	4.2 V	4			14-SOIC	85 °C	-40 °C		1.8 V	0.5 V		5.2 mA	5.2 mA	2		2 V	6 V	AND Gate	17 ns	Surface Mount	0.154 in	3.9 mm
Texas Instruments SN74HC08QPWRQ1	1.5 V	4.2 V	4	0.173 "	4.4 mm	14-TSSOP	125 °C	-40 °C	Automotive	1.8 V	0.5 V	14-TSSOP	5.2 mA	5.2 mA	2	AEC-Q100	2 V	6 V	AND Gate	17 ns	Surface Mount
Texas Instruments SN74HC08DRG4	1.5 V	4.2 V	4			14-SOIC	85 °C	-40 °C		1.8 V	0.5 V		5.2 mA	5.2 mA	2		2 V	6 V	AND Gate	17 ns	Surface Mount	0.154 in	3.9 mm
Texas Instruments SN74HC08AN	1.9 V	5.9 V	4			14-DIP	85 °C	-40 °C					4 mA	4 mA	2		2 V	6 V	AND Gate	13 ns	Through Hole	0.3 "	7.62 mm
Texas Instruments SN74HC08ADBR	1.9 V	5.9 V	4			14-SSOP	85 °C	-40 °C				14-SSOP	4 mA	4 mA	2		2 V	6 V	AND Gate	13 ns	Surface Mount			5.3 mm	0.209 "
Texas Instruments CD74HC08EG4	1.5 V	4.2 V	4			14-DIP	125 °C	-55 °C		1.8 V	0.5 V		5.2 mA	5.2 mA	2		2 V	6 V	AND Gate	15 ns	Through Hole	0.3 "	7.62 mm
Texas Instruments CD74HC08QM96EP	1.5 V	4.2 V	4			14-SOIC	125 °C	-40 °C		1.8 V	0.5 V		5.2 mA	5.2 mA	2		2 V	6 V	AND Gate	15 ns	Surface Mount	0.154 in	3.9 mm
Texas Instruments SN74HC08N	1.5 V	4.2 V	4			14-DIP	85 °C	-40 °C		1.8 V	0.5 V		5.2 mA	5.2 mA	2		2 V	6 V	AND Gate	17 ns	Through Hole	0.3 "	7.62 mm
Texas Instruments SN74HC08QPWRG4Q1	1.5 V	4.2 V	4	0.173 "	4.4 mm	14-TSSOP	125 °C	-40 °C	Automotive	1.8 V	0.5 V	14-TSSOP	5.2 mA	5.2 mA	2	AEC-Q100	2 V	6 V	AND Gate	17 ns	Surface Mount

Catalog

Enhanced product, 4-ch, 2-input 2-V to 6-V 5.2-mA drive strength AND gate

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeBuffered InputsTypical Propagation Delay 7 ns at VCC= 5 V, CL= 15 pF, TA= 25°CFanout (Over Temperature Range)Standard Outputs ... 10 LSTTL LoadsBus Driver Outputs ... 15 LSTTL LoadsBalanced Propagation Delay and Transition TimesSignificant Power Reduction Compared to LSTTL Logic ICs2-V to 6-V VCCOperationHigh Noise Immunity NILor NIH= 30% of VCCat VCC= 5 VCMOS Input Compatibility, Il1 µA at VOL, VOHComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeBuffered InputsTypical Propagation Delay 7 ns at VCC= 5 V, CL= 15 pF, TA= 25°CFanout (Over Temperature Range)Standard Outputs ... 10 LSTTL LoadsBus Driver Outputs ... 15 LSTTL LoadsBalanced Propagation Delay and Transition TimesSignificant Power Reduction Compared to LSTTL Logic ICs2-V to 6-V VCCOperationHigh Noise Immunity NILor NIH= 30% of VCCat VCC= 5 VCMOS Input Compatibility, Il1 µA at VOL, VOHComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The CD74HC08 logic gates utilize silicon-gate CMOS technology to achieve operating speeds similar to LSTTL gates, with the low power consumption of standard CMOS integrated circuits. All devices can drive 10 LSTTL loads. The CD74HC08 logic gates utilize silicon-gate CMOS technology to achieve operating speeds similar to LSTTL gates, with the low power consumption of standard CMOS integrated circuits. All devices can drive 10 LSTTL loads.