
SN74AHC1G86-EP Series
Enhanced product single 2-input, 2-V to 5.5-V XOR (exclusive OR) gate
Manufacturer: Texas Instruments
Catalog
Enhanced product single 2-input, 2-V to 5.5-V XOR (exclusive OR) gate
Key Features
• Controlled BaselineOne Assembly SiteOne Test SiteOne Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Operating Range of 2 V to 5.5 VMax tpdof 10 ns at 5 VLow Power Consumption, 10 µA Max ICC±8 mA Output Drive at 5 VSchmitt Trigger Action at All Inputs Makes the Circuit Tolerant for Slower Input Rise and Fall TimeLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly SiteOne Test SiteOne Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Operating Range of 2 V to 5.5 VMax tpdof 10 ns at 5 VLow Power Consumption, 10 µA Max ICC±8 mA Output Drive at 5 VSchmitt Trigger Action at All Inputs Makes the Circuit Tolerant for Slower Input Rise and Fall TimeLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
Description
AI
The SN74AHC1G86-Q1 is a single 2-input exclusive-OR gate. The device performs the Boolean function Y = A ⊕ B or Y = AB + A B in positive logic.
A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.
The SN74AHC1G86-Q1 is a single 2-input exclusive-OR gate. The device performs the Boolean function Y = A ⊕ B or Y = AB + A B in positive logic.
A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.