SN74AHC00-EP Series

Enhanced product 4-ch, 2-input, 2-V to 5.5-V NAND gates

Catalog

Enhanced product 4-ch, 2-input, 2-V to 5.5-V NAND gates

Part	Number of Circuits	Mounting Type	Number of Inputs	Max Propagation Delay @ V, Max CL	Operating Temperature [Max]	Operating Temperature [Min]	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Input Logic Level - Low [Min]	Input Logic Level - Low [Max]	Logic Type	Package / Case	Voltage - Supply [Max]	Voltage - Supply [Min]	Input Logic Level - High [Max]	Input Logic Level - High [Min]	Supplier Device Package	Package / Case [custom]	Package / Case [custom]	Package / Case [y]	Package / Case [x]	Qualification	Grade
Texas Instruments SN74AHC00RGYR	4	Surface Mount	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-VFQFN Exposed Pad	5.5 V	2 V	3.85 V	1.5 V	14-VQFN (3.5x3.5)
Texas Instruments SN74AHC00PWRE4	4	Surface Mount	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-TSSOP	5.5 V	2 V	3.85 V	1.5 V	14-TSSOP	0.173 "	4.4 mm
Texas Instruments SN74AHC00PWRG4	4	Surface Mount	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-TSSOP	5.5 V	2 V	3.85 V	1.5 V	14-TSSOP	0.173 "	4.4 mm
Texas Instruments SN74AHC00PWR	4	Surface Mount	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-TSSOP	5.5 V	2 V	3.85 V	1.5 V	14-TSSOP	0.173 "	4.4 mm
Texas Instruments SN74AHC00BQAR	4	Surface Mount	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-WFQFN Exposed Pad	5.5 V	2 V	3.85 V	1.5 V	14-WQFN (3x2.5)
Texas Instruments SN74AHC00N	4	Through Hole	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-DIP	5.5 V	2 V	3.85 V	1.5 V				7.62 mm	0.3 "
Texas Instruments SN74AHC00D	4	Surface Mount	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-SOIC	5.5 V	2 V	3.85 V	1.5 V				3.9 mm	0.154 in
Texas Instruments SN74AHC00MDREP	4	Surface Mount	2	7.5 ns	125 °C	-55 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-SOIC	5.5 V	2 V	3.85 V	1.5 V				3.9 mm	0.154 in
Texas Instruments SN74AHC00QDRQ1	4	Surface Mount	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-SOIC	5.5 V	2 V	3.85 V	1.5 V				3.9 mm	0.154 in	AEC-Q100	Automotive
Texas Instruments SN74AHC00DGVRE4	4	Surface Mount	2	7.5 ns	125 °C	-40 °C	8 mA	8 mA	0.5 V	1.65 V	NAND Gate	14-TFSOP	5.5 V	2 V	3.85 V	1.5 V					0.173 in 4.4 mm

Catalog

Enhanced product 4-ch, 2-input, 2-V to 5.5-V NAND gates

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product Change Notification Qualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessEPIC is a trademark of Texas Instruments.Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product Change Notification Qualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessEPIC is a trademark of Texas Instruments.Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

Description

The SN74AHC00 device performs the Boolean function Y = A • B or Y = A + B in positive logic. The SN74AHC00 device performs the Boolean function Y = A • B or Y = A + B in positive logic.