SN74LVC157A-Q1 Series
Enhanced Product quadruple 2-line to 1-line data selector / multiplexer
Manufacturer: Texas Instruments
Catalog
Enhanced Product quadruple 2-line to 1-line data selector / multiplexer
| Part | Grade | Operating Temperature [Max] | Operating Temperature [Min] | Voltage - Supply [Max] | Voltage - Supply [Min] | Package / Case [x] | Package / Case | Package / Case [y] | Current - Output High, Low | Voltage Supply Source | Independent Circuits | Qualification | Type | Supplier Device Package | Mounting Type | Circuit [custom] | Circuit [custom] | Package / Case | Package / Case |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
 Texas Instruments | Automotive | 125 °C | -40 °C | 3.6 V | 2 V | 0.173 in | 16-TSSOP | 4.4 mm | 24 mA | Single Supply | 1 | AEC-Q100 | Multiplexer | 16-TSSOP | Surface Mount | 4 | 2:1 | ||
 Texas Instruments | 85 °C | -40 °C | 3.6 V | 2 V | 0.173 in | 16-TSSOP | 4.4 mm | 24 mA | Single Supply | 1 | Multiplexer | 16-TSSOP | Surface Mount | 4 | 2:1 | ||||
 Texas Instruments | 85 °C | -40 °C | 3.6 V | 2 V | 16-SOIC | 24 mA | Single Supply | 1 | Multiplexer | 16-SO | Surface Mount | 4 | 2:1 | 0.209 " | 5.3 mm | ||||
 Texas Instruments | 85 °C | -40 °C | 3.6 V | 2 V | 0.154 in | 16-SOIC | 3.9 mm | 24 mA | Single Supply | 1 | Multiplexer | 16-SOIC | Surface Mount | 4 | 2:1 | ||||
Texas Instruments | Automotive | 125 °C | -40 °C | 3.6 V | 2 V | 0.173 in | 16-TSSOP | 4.4 mm | 24 mA | Single Supply | 1 | AEC-Q100 | Multiplexer | 16-TSSOP | Surface Mount | 4 | 2:1 | ||
Texas Instruments | 85 °C | -40 °C | 3.6 V | 2 V | 0.173 in | 16-TSSOP | 4.4 mm | 24 mA | Single Supply | 1 | Multiplexer | 16-TSSOP | Surface Mount | 4 | 2:1 | ||||
 Texas Instruments | 85 °C | -40 °C | 3.6 V | 2 V | 16-SOIC | 24 mA | Single Supply | 1 | Multiplexer | 16-SO | Surface Mount | 4 | 2:1 | 0.209 " | 5.3 mm | ||||
Texas Instruments | 125 °C | -40 °C | 3.6 V | 2 V | 0.173 in | 16-TSSOP | 4.4 mm | 24 mA | Single Supply | 1 | Multiplexer | 16-TSSOP | Surface Mount | 4 | 2:1 | ||||
 Texas Instruments | 85 °C | -40 °C | 3.6 V | 2 V | 16-VFQFN Exposed Pad | 24 mA | Single Supply | 1 | Multiplexer | 16-VQFN (4x3.5) | Surface Mount | 4 | 2:1 | ||||||
Texas Instruments | 85 °C | -40 °C | 3.6 V | 2 V | 0.154 in | 16-SOIC | 3.9 mm | 24 mA | Single Supply | 1 | Multiplexer | 16-SOIC | Surface Mount | 4 | 2:1 |
Key Features
• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Operates From 2 V to 3.6 VInputs Accept Voltages to 5.5 VMax tpdof 5.4 ns at 3.3 VTypical VOLP(Output Ground Bounce)<0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot)>2 V at VCC= 3.3 V, TA= 25°CComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Operates From 2 V to 3.6 VInputs Accept Voltages to 5.5 VMax tpdof 5.4 ns at 3.3 VTypical VOLP(Output Ground Bounce)<0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot)>2 V at VCC= 3.3 V, TA= 25°CComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
Description
AI
The SN74LVC157A-EP quadruple 2-line to 1-line data selector/multiplexer is designed for 2.7-V to 3.6-V VCCoperation.
This device features a common strobe (G)\ input. When G\ is high, all outputs are low. When G\ is low, a 4-bit word is selected from one of two sources and is routed to the four outputs. The device provides true data.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.
The SN74LVC157A-EP quadruple 2-line to 1-line data selector/multiplexer is designed for 2.7-V to 3.6-V VCCoperation.
This device features a common strobe (G)\ input. When G\ is high, all outputs are low. When G\ is low, a 4-bit word is selected from one of two sources and is routed to the four outputs. The device provides true data.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.