SN74LVC1G97-EP Series

Automotive Catalog Configurable Multiple-Function Gate

Catalog

Automotive Catalog Configurable Multiple-Function Gate

Part	Package / Case	Number of Circuits	Voltage - Supply [Max]	Voltage - Supply [Min]	Mounting Type	Current - Output High, Low [y]	Current - Output High, Low [x]	Number of Inputs	Supplier Device Package	Output Type	Logic Type	Operating Temperature [Max]	Operating Temperature [Min]	Supplier Device Package [y]	Supplier Device Package [x]
Texas Instruments SN74LVC1G97DCKRE4	6-TSSOP SC-88 SOT-363	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	SC-70-6	Single-Ended	Configurable Multiple Function	125 °C	-40 °C
Texas Instruments SN74LVC1G97DBVRG4	SOT-23-6	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	SOT-23-6	Single-Ended	Configurable Multiple Function	125 °C	-40 °C
Texas Instruments SN74LVC1G97DBVR	SOT-23-6	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	SOT-23-6	Single-Ended	Configurable Multiple Function	125 °C	-40 °C
Texas Instruments SN74LVC1G97DCKTG4	6-TSSOP SC-88 SOT-363	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	SC-70-6	Single-Ended	Configurable Multiple Function	125 °C	-40 °C
Texas Instruments SN74LVC1G97DRLRG4	SOT-563 SOT-666	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	SOT-5X3	Single-Ended	Configurable Multiple Function	125 °C	-40 °C
Texas Instruments SN74LVC1G97YEPR	6-XFBGA DSBGA	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	6-DSBGA	Single-Ended	Configurable Multiple Function	85 °C	-40 °C
Texas Instruments SN74LVC1G97YZPRB	6-XFBGA DSBGA	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	6-DSBGA	Single-Ended	Configurable Multiple Function	85 °C	-40 °C	0.89	1.39
Texas Instruments SN74LVC1G97YZAR	6-XFBGA DSBGA	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	6-DSBGA	Single-Ended	Configurable Multiple Function	85 °C	-40 °C
Texas Instruments SN74LVC1G97YEAR	6-XFBGA DSBGA	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	6-DSBGA	Single-Ended	Configurable Multiple Function	85 °C	-40 °C
Texas Instruments SN74LVC1G97DCK3	6-TSSOP SC-88 SOT-363	1	5.5 V	1.65 V	Surface Mount	32 mA	32 mA	3	SC-70-6	Single-Ended	Configurable Multiple Function	125 °C	-40 °C

Catalog

Automotive Catalog Configurable Multiple-Function Gate

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeSupports 5-V VCCOperationInputs Accept Voltages to 5.5 VMax tpdof 6.3 ns at 3.3 VLow Power Consumption, 10-µA Max ICC±24-mA Output Drive at 3.3 VIoffSupports Partial-Power-Down Mode OperationLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)Choose From Nine Specific Logic FunctionsComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and moldcompound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeSupports 5-V VCCOperationInputs Accept Voltages to 5.5 VMax tpdof 6.3 ns at 3.3 VLow Power Consumption, 10-µA Max ICC±24-mA Output Drive at 3.3 VIoffSupports Partial-Power-Down Mode OperationLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)Choose From Nine Specific Logic FunctionsComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and moldcompound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The SN74LVC1G97 device features configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter, and noninverter. All inputs can be connected to VCCor GND. This configurable multiple-function gate is designed for 1.65-V to 5.5-V VCCoperation. This device functions as an independent gate, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT–) signals. NanoFree package technology is a major break-through in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. The SN74LVC1G97 device features configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter, and noninverter. All inputs can be connected to VCCor GND. This configurable multiple-function gate is designed for 1.65-V to 5.5-V VCCoperation. This device functions as an independent gate, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT–) signals. NanoFree package technology is a major break-through in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.