LM211-Q1 Series

Automotive Catalog Differential Comparator With Strobes

Catalog

Automotive Catalog Differential Comparator With Strobes

Part	Supplier Device Package	Voltage - Supply, Single/Dual (±) [Min]	Voltage - Supply, Single/Dual (±) [Max]	Package / Case	Package / Case [y]	Package / Case [x]	Output Type	Mounting Type	Number of Elements	Current - Input Bias (Max)	Current - Quiescent (Max) [Max]	Current - Output (Typ)	Operating Temperature [Max]	Operating Temperature [Min]	Voltage - Input Offset (Max) [Max]	Type	Package / Case [custom]	Package / Case [custom]	Qualification	Grade
Texas Instruments LM211QD	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	125 °C	-40 °C	3 mV	General Purpose
Texas Instruments LM211QDR	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	125 °C	-40 °C	3 mV	General Purpose
Texas Instruments LM211QDG4	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	125 °C	-40 °C	3 mV	General Purpose
Texas Instruments LM211PW	8-TSSOP	1.75 V 3.5 V	15 V 30 V	8-TSSOP			DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	85 °C	-40 °C	3 mV	General Purpose	0.173 "	4.4 mm
Texas Instruments LM211QDRG4	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	125 °C	-40 °C	3 mV	General Purpose
Texas Instruments LM211QDRG4Q1	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	125 °C	-40 °C	3 mV	General Purpose			AEC-Q100	Automotive
Texas Instruments LM211QDRQ1	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	125 °C	-40 °C	3 mV	General Purpose			AEC-Q100	Automotive
Texas Instruments LM211QDREP	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	125 °C	-40 °C	3 mV	General Purpose
Texas Instruments LM211DRG4	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	85 °C	-40 °C	3 mV	General Purpose
Texas Instruments LM211DG4	8-SOIC	1.75 V 3.5 V	15 V 30 V	8-SOIC	3.9 mm	0.154 in	DTL MOS Open-Collector Open-Emitter RTL TTL	Surface Mount	1	0.1 µA	6 mA	50 mA	85 °C	-40 °C	3 mV	General Purpose

Catalog

Automotive Catalog Differential Comparator With Strobes

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product Change NotificationQualification Pedigree(1)Fast Response TimesStrobe CapabilityMaximum Input Bias Current . . . 300 nAMaximum Input Offset Current . . . 70 nACan Operate From Single 5-V Supply(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product Change NotificationQualification Pedigree(1)Fast Response TimesStrobe CapabilityMaximum Input Bias Current . . . 300 nAMaximum Input Offset Current . . . 70 nACan Operate From Single 5-V Supply(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The LM111, LM211, and LM311 devices are single high-speed voltage comparators. These devices are designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. These comparators are capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+or VCC−. Offset balancing and strobe capabilities are available, and the outputs can be wire-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input. The LM111, LM211, and LM311 devices are single high-speed voltage comparators. These devices are designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. These comparators are capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+or VCC−. Offset balancing and strobe capabilities are available, and the outputs can be wire-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.