SN74ACT74-EP Series

Enhanced Product Dual Positive-Edge-Triggered D-Type Flip-Flops With Clear And Preset

Catalog

Enhanced Product Dual Positive-Edge-Triggered D-Type Flip-Flops With Clear And Preset

Part	Max Propagation Delay @ V, Max CL	Function	Output Type	Current - Output High, Low	Trigger Type	Number of Bits per Element	Number of Elements	Voltage - Supply [Min]	Voltage - Supply [Max]	Operating Temperature [Max]	Operating Temperature [Min]	Package / Case [x]	Package / Case [y]	Package / Case	Input Capacitance	Mounting Type	Clock Frequency	Current - Quiescent (Iq)	Type	Operating Temperature [Max]	Operating Temperature [Min]	Supplier Device Package	Package / Case [custom]	Package / Case [custom]
Texas Instruments SN74ACT74MDREP	11 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V	125 °C	-55 °C	0.154 in	3.9 mm	14-SOIC	3 pF	Surface Mount	210 MHz	2 µA	D-Type
Texas Instruments SN74ACT74DR	7.5 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V			0.154 in	3.9 mm	14-SOIC	3 pF	Surface Mount	210 MHz	2 µA	D-Type	85 °C	-40 °C
Texas Instruments SN74ACT74DRG4	11 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V			0.154 in	3.9 mm	14-SOIC	3 pF	Surface Mount	210 MHz	2 µA	D-Type	85 °C	-40 °C
Texas Instruments SN74ACT74NSR	11 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V			0.209 "	5.3 mm	14-SOIC	3 pF	Surface Mount	210 MHz	2 µA	D-Type	85 °C	-40 °C	14-SO
Texas Instruments CD74ACT74M	9.5 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V	125 °C	-55 °C	0.154 in	3.9 mm	14-SOIC	10 pF	Surface Mount	85 MHz	4 çA	D-Type
Texas Instruments SN74ACT74D	7.5 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V			0.154 in	3.9 mm	14-SOIC	3 pF	Surface Mount	210 MHz	2 µA	D-Type	85 °C	-40 °C
Texas Instruments CD74ACT74ME4	9.5 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V	125 °C	-55 °C	0.154 in	3.9 mm	14-SOIC	10 pF	Surface Mount	85 MHz	4 çA	D-Type
Texas Instruments SN74ACT74NG4	11 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V			0.3 "	7.62 mm	14-DIP	3 pF	Through Hole	210 MHz	2 µA	D-Type	85 °C	-40 °C
Texas Instruments V62/04725-01XE	11 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V	125 °C	-55 °C	0.154 in	3.9 mm	14-SOIC	3 pF	Surface Mount	210 MHz	2 µA	D-Type
Texas Instruments SN74ACT74PW	11 ns	Reset Set(Preset)	Complementary	24 mA	Positive Edge	1	2	4.5 V	5.5 V					14-TSSOP	3 pF	Surface Mount	210 MHz	2 µA	D-Type	85 °C	-40 °C	14-TSSOP	0.173 "	4.4 mm

Catalog

Enhanced Product Dual Positive-Edge-Triggered D-Type Flip-Flops With Clear And Preset

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree4.5-V to 5.5-V VCCOperationInputs Accept Voltages to 5.5 VMax tpdof 10.5 ns at 5 VInputs Are TTL-Voltage CompatibleComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree4.5-V to 5.5-V VCCOperationInputs Accept Voltages to 5.5 VMax tpdof 10.5 ns at 5 VInputs Are TTL-Voltage CompatibleComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The SN74ACT74-EP is a dual positive-edge-triggered D-type flip-flop. A low level at the preset (PRE\) or clear (CLR\) input sets or resets the outputs, regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the data (D) input meeting the setup-time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at D can be changed without affecting the levels at the outputs. The SN74ACT74-EP is a dual positive-edge-triggered D-type flip-flop. A low level at the preset (PRE\) or clear (CLR\) input sets or resets the outputs, regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the data (D) input meeting the setup-time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at D can be changed without affecting the levels at the outputs.