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SN74LVC32A-EP

SN74LVC32A-EP Series

Enhanced product, 4-ch, 2-input 2-V to 3.6-V 24-mA drive strength OR gate

Manufacturer: Texas Instruments

Catalog

Enhanced product, 4-ch, 2-input 2-V to 3.6-V 24-mA drive strength OR gate

PartMax Propagation Delay @ V, Max CLInput Logic Level - High [Min]Input Logic Level - High [Max]Mounting TypeInput Logic Level - Low [Max]Input Logic Level - Low [Min]Current - Output High, LowOperating Temperature [Max]Operating Temperature [Min]Number of CircuitsSupplier Device PackagePackage / Case [custom]Package / Case [custom]Package / CaseCurrent - Quiescent (Max) [Max]Number of InputsLogic TypeVoltage - Supply [Min]Voltage - Supply [Max]Package / Case [x]Package / Case [y]Package / CasePackage / CaseInput Logic Level - LowGradeQualification
TSSOP (PW)
Texas Instruments
SN74LVC32APWT
3.6 ns
1.7 V
2 V
Surface Mount
0.8 V
0.7 V
24 mA
125 °C
-40 °C
4
14-TSSOP
0.173 "
4.4 mm
14-TSSOP
1 çA
2
OR Gate
1.65 V
3.6 V
14-SOIC
Texas Instruments
SN74LVC32ADTG4
3.6 ns
1.7 V
2 V
Surface Mount
0.8 V
0.7 V
24 mA
125 °C
-40 °C
4
14-SOIC
1 çA
2
OR Gate
1.65 V
3.6 V
0.154 in
3.9 mm
SSOP (DB)
Texas Instruments
SN74LVC32ADBR
3.6 ns
1.7 V
2 V
Surface Mount
0.8 V
0.7 V
24 mA
125 °C
-40 °C
4
14-SSOP
14-SSOP
1 çA
2
OR Gate
1.65 V
3.6 V
5.3 mm
0.209 "
TSSOP (PW)
Texas Instruments
SN74LVC32AMPWREPG4
3.8 ns
Surface Mount
24 mA
125 °C
-55 °C
4
14-TSSOP
0.173 "
4.4 mm
14-TSSOP
10 µA
2
OR Gate
2 V
3.6 V
0.8 V
14-TSSOP
Texas Instruments
SN74LVC32AMPWREP
3.8 ns
Surface Mount
24 mA
125 °C
-55 °C
4
14-TSSOP
0.173 "
4.4 mm
14-TSSOP
10 µA
2
OR Gate
2 V
3.6 V
0.8 V
TSSOP (PW)
Texas Instruments
SN74LVC32AQPWREP
3.8 ns
Surface Mount
24 mA
125 °C
-40 °C
4
14-TSSOP
0.173 "
4.4 mm
14-TSSOP
10 µA
2
OR Gate
2 V
3.6 V
0.8 V
14-VQFN
Texas Instruments
SN74LVC32ARGYR
3.6 ns
1.7 V
2 V
Surface Mount
0.8 V
0.7 V
24 mA
85 °C
-40 °C
4
14-VQFN (3.5x3.5)
14-VFQFN Exposed Pad
1 çA
2
OR Gate
1.65 V
3.6 V
14-TSSOP
Texas Instruments
SN74LVC32APWR
3.6 ns
1.7 V
2 V
Surface Mount
0.8 V
0.7 V
24 mA
125 °C
-40 °C
4
14-TSSOP
0.173 "
4.4 mm
14-TSSOP
1 çA
2
OR Gate
1.65 V
3.6 V
TSSOP (PW)
Texas Instruments
SN74LVC32APWRG4
3.6 ns
1.7 V
2 V
Surface Mount
0.8 V
0.7 V
24 mA
125 °C
-40 °C
4
14-TSSOP
0.173 "
4.4 mm
14-TSSOP
1 çA
2
OR Gate
1.65 V
3.6 V
14-SOIC
Texas Instruments
SN74LVC32AQDRQ1
3.8 ns
Surface Mount
24 mA
125 °C
-40 °C
4
14-SOIC
10 µA
2
OR Gate
2 V
3.6 V
0.154 in
3.9 mm
0.8 V
Automotive
AEC-Q100

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -40°C to 125°C and -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Operates From 2 V to 3.6 VInputs Accept Voltages to 5.5 VMax tpdof 3.8 ns at 3.3 VTypical VOLP(Output Ground Bounce) <.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2 V at VCC= 3.3 V, TA= 25°CESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -40°C to 125°C and -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Operates From 2 V to 3.6 VInputs Accept Voltages to 5.5 VMax tpdof 3.8 ns at 3.3 VTypical VOLP(Output Ground Bounce) <.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2 V at VCC= 3.3 V, TA= 25°CESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

AI
The SN74LVC32A quadruple 2-input positive-OR gate is designed for 2.7-V to 3.6-V VCCoperation. The device performs the Boolean function Y = A + B or Y =A\ • B\in positive logic. Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment. The SN74LVC32A quadruple 2-input positive-OR gate is designed for 2.7-V to 3.6-V VCCoperation. The device performs the Boolean function Y = A + B or Y =A\ • B\in positive logic. Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in a mixed 3.3-V/5-V system environment.