SN54SC245-SEP Series

1.2-V to 5.5-V, octal bus transceiver with 3-state outputs in space enhanced plastic

Catalog

1.2-V to 5.5-V, octal bus transceiver with 3-state outputs in space enhanced plastic

Part	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Mounting Type	Number of Bits per Element	Output Type	Voltage - Supply [Min]	Voltage - Supply [Max]	Number of Elements	Supplier Device Package	Package / Case [y]	Package / Case	Package / Case [x]	Operating Temperature [Min]	Operating Temperature [Max]
Texas Instruments SN54SC245MPWTSEP	8 mA	8 mA	Surface Mount	8	3-State	1.2 V	5.5 V	1	20-TSSOP	4.4 mm	20-TSSOP	0.173 in	-55 °C	125 °C

Catalog

1.2-V to 5.5-V, octal bus transceiver with 3-state outputs in space enhanced plastic

Key Features

• Vendor item drawing available, VID V62/23616Total ionizing dose characterized at 30 krad(Si)Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si)Single-event effects (SEE) characterized:Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mgSingle event transient (SET) characterized to 43 MeV-cm2 /mgWide operating range of 1.2 V to 5.5 V5.5 V tolerant input pinsOutput drive up to 25 mA at 5-VLatch-up performance exceeds 250 mA per JESD 17Space enhanced plastic (SEP)Controlled baselineGold bondwireNiPdAu lead finishOne assembly and test siteOne fabrication siteMilitary (–55°C to 125°C) temperature rangeExtended product life cycleProduct traceabilityMeets NASAs ASTM E595 outgassing specificationVendor item drawing available, VID V62/23616Total ionizing dose characterized at 30 krad(Si)Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si)Single-event effects (SEE) characterized:Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mgSingle event transient (SET) characterized to 43 MeV-cm2 /mgWide operating range of 1.2 V to 5.5 V5.5 V tolerant input pinsOutput drive up to 25 mA at 5-VLatch-up performance exceeds 250 mA per JESD 17Space enhanced plastic (SEP)Controlled baselineGold bondwireNiPdAu lead finishOne assembly and test siteOne fabrication siteMilitary (–55°C to 125°C) temperature rangeExtended product life cycleProduct traceabilityMeets NASAs ASTM E595 outgassing specification