
AD4080 Series
20-Bit, 40 MSPS, Differential SAR ADC
Manufacturer: Analog Devices Inc./Maxim Integrated
Catalog
20-Bit, 40 MSPS, Differential SAR ADC
Description
AI
The AD4080 is a high-speed, low noise, low distortion, 20-bit, Easy Drive, successive approximation register (SAR) analog-to-digital converter (ADC). Maintaining high performance (signal-to-noise and distortion (SINAD) ratio > 90 dBFS) at signal frequencies in excess of 1 MHz enables the AD4080 to service a wide variety of precision, wide bandwidth data acquisition applications. Simplification of the input anti-alias filter design can be accomplished by applying oversampling along with the integrated digital filtering and decimation to reduce noise and lower the output data rate for applications that do not require the lowest latency of the AD4080.The AD4080 Easy Drive features reduce both signal chain complexity and power consumption while enabling greater channel density and flexibility in companion component selection. The product input structure was designed to minimize any input dependent signal currents; therefore, reducing any converter induced settling artifacts. The continuous acquisition architecture allows settling across the entire conversion cycle, easing ADC driver settling and bandwidth requirements as compared to other high-speed data converters.The AD4080 includes several elements that simplify data converter integration: a low drift reference buffer, low dropout (LDO) regulators to generate ADC core and digital interface supply rails, and a 16K result data first-in first out (FIFO) that can greatly reduce the load on the digital host. Additionally, critical supply and reference decoupling capacitors are integrated in the package to ensure optimum performance, simplify printed circuit board (PCB) layout, and reduce the overall solution footprint.APPLICATIONSDigital imagingCell analysisSpectroscopyAutomated test equipmentHigh speed data acquisitionDigital control loops, hardware in the loopPower quality analysisSource measurement unitsElectron and x-ray microscopyRadar level measurementNondestructive testPredictive maintenance and structural health