SN74AHC02-EP Series

Enhanced product 4-ch, 2-input, 2-V to 5.5-V NOR gates

Catalog

Enhanced product 4-ch, 2-input, 2-V to 5.5-V NOR gates

Part	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Supplier Device Package	Operating Temperature [Max]	Operating Temperature [Min]	Number of Circuits	Max Propagation Delay @ V, Max CL	Number of Inputs	Input Logic Level - High [Max]	Input Logic Level - High [Min]	Mounting Type	Voltage - Supply [Max]	Voltage - Supply [Min]	Input Logic Level - Low [Min]	Input Logic Level - Low [Max]	Logic Type	Package / Case [custom]	Package / Case [custom]	Package / Case	Package / Case	Package / Case	Package / Case [x]	Package / Case [y]	Qualification	Grade
Texas Instruments SN74AHC02PW	8 mA	8 mA	14-TSSOP	125 °C	-40 °C	4	8.5 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate	0.173 "	4.4 mm	14-TSSOP
Texas Instruments SN74AHC02PWRG4	8 mA	8 mA	14-TSSOP	125 °C	-40 °C	4	8.5 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate	0.173 "	4.4 mm	14-TSSOP
Texas Instruments SN74AHC02RGYRG4	8 mA	8 mA	14-VQFN (3.5x3.5)	125 °C	-40 °C	4	8.5 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate			14-VFQFN Exposed Pad
Texas Instruments SN74AHC02RGYR	8 mA	8 mA	14-VQFN (3.5x3.5)	125 °C	-40 °C	4	8.5 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate			14-VFQFN Exposed Pad
Texas Instruments SN74AHC02DBR	8 mA	8 mA	14-SSOP	125 °C	-40 °C	4	8.5 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate			14-SSOP	5.3 mm	0.209 "
Texas Instruments SN74AHC02D	8 mA	8 mA		125 °C	-40 °C	4	8.5 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate			14-SOIC			0.154 in	3.9 mm
Texas Instruments SN74AHC02DR	8 mA	8 mA		125 °C	-40 °C	4	8.5 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate			14-SOIC			0.154 in	3.9 mm
Texas Instruments SN74AHC02QWBQARQ1	8 mA	8 mA	14-WQFN (3x2.5)	125 °C	-40 °C	4	7.5 ns	2	3.85 V	1.5 V	Surface Mount Wettable Flank	5.5 V	2 V	0.5 V	1.65 V	NOR Gate			14-WFDFN Exposed Pad					AEC-Q100	Automotive
Texas Instruments SN74AHC02PWR	8 mA	8 mA	14-TSSOP	125 °C	-40 °C	4	8.5 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate	0.173 "	4.4 mm	14-TSSOP
Texas Instruments SN74AHC02BQAR	8 mA	8 mA	14-WQFN (3x2.5)	125 °C	-40 °C	4	5.1 ns	2	3.85 V	1.5 V	Surface Mount	5.5 V	2 V	0.5 V	1.65 V	NOR Gate			14-WFQFN Exposed Pad

Catalog

Enhanced product 4-ch, 2-input, 2-V to 5.5-V NOR gates

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeOperating Range 2-V to 5.5-V VCCLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeOperating Range 2-V to 5.5-V VCCLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The ’AHC02 device contains four independent 2-input NOR gates that perform the Boolean function Y = A\ • B\ or Y = (A + B)\ in positive logic. The ’AHC02 device contains four independent 2-input NOR gates that perform the Boolean function Y = A\ • B\ or Y = (A + B)\ in positive logic.