SN74CBTLV3257-EP Series

Enhanced Product low-voltage 4-bit 1-Of-2 FET multiplexer/demultiplexer

Catalog

Enhanced Product low-voltage 4-bit 1-Of-2 FET multiplexer/demultiplexer

Part	Independent Circuits	Type	Voltage Supply Source	Voltage - Supply [Min]	Voltage - Supply [Max]	Package / Case [x]	Package / Case	Package / Case [y]	Supplier Device Package	Mounting Type	Operating Temperature [Min]	Operating Temperature [Max]	Circuit [custom]	Circuit [custom]
Texas Instruments CCBTLV3257MPWREP	1	FET Multiplexer/Demux	Single Supply	2.3 V	3.6 V	0.173 in	16-TSSOP	4.4 mm	16-TSSOP	Surface Mount	-55 °C	125 °C	4	2:1

Catalog

Enhanced Product low-voltage 4-bit 1-Of-2 FET multiplexer/demultiplexer

Key Features

• Controlled baselineOne assembly siteOne test siteOne fabrication siteExtended temperature performance of –55°C to 125°CEnhanced diminishing manufacturing sources (DMS) supportEnhanced product-change notificationQualification pedigree(1)5-Ω switch connection between two portsRail-to-rail switching on data I/O portsIoffsupports partial-power-down mode operationLatch-up performance exceeds 100 mA per JESD 78, class IIESD protection exceeds JESD 222000-V human-body model (A114-A)200-V machine model (A115-A)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled baselineOne assembly siteOne test siteOne fabrication siteExtended temperature performance of –55°C to 125°CEnhanced diminishing manufacturing sources (DMS) supportEnhanced product-change notificationQualification pedigree(1)5-Ω switch connection between two portsRail-to-rail switching on data I/O portsIoffsupports partial-power-down mode operationLatch-up performance exceeds 100 mA per JESD 78, class IIESD protection exceeds JESD 222000-V human-body model (A114-A)200-V machine model (A115-A)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The SN74CBTLV3257 is a 4-bit 1-of-2 high-speed FET multiplexer/demultiplexer. The low on-state resistance of the switch allows connections to be made with minimal propagation delay. The select (S) input controls the data flow. The FET multiplexers/demultiplexers are disabled when the output-enable (OE) input is high. This device is fully specified for partial-power-down applications using Ioff. The Iofffeature ensures that damaging current does not backflow through the device when it is powered down. The device has isolation during power off. To ensure the high-impedance state during power up or power down,OEshould be tied to VCCthrough a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. The SN74CBTLV3257 is a 4-bit 1-of-2 high-speed FET multiplexer/demultiplexer. The low on-state resistance of the switch allows connections to be made with minimal propagation delay. The select (S) input controls the data flow. The FET multiplexers/demultiplexers are disabled when the output-enable (OE) input is high. This device is fully specified for partial-power-down applications using Ioff. The Iofffeature ensures that damaging current does not backflow through the device when it is powered down. The device has isolation during power off. To ensure the high-impedance state during power up or power down,OEshould be tied to VCCthrough a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.