SN74LVC1G98-EP Series

Enhanced Product Configurable Multiple-Function Gate

Catalog

Enhanced Product Configurable Multiple-Function Gate

Part	Voltage - Supply [Max]	Voltage - Supply [Min]	Package / Case	Current - Output High, Low [y]	Current - Output High, Low [x]	Grade	Mounting Type	Number of Inputs	Logic Type	Operating Temperature [Max]	Operating Temperature [Min]	Number of Circuits	Output Type	Qualification	Supplier Device Package
Texas Instruments SN74LVC1G98QDBVRQ1	5.5 V	1.65 V	SOT-23-6	32 mA	32 mA	Automotive	Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended	AEC-Q100	SOT-23-6
Texas Instruments SN74LVC1G98DCKT	5.5 V	1.65 V	6-TSSOP SC-88 SOT-363	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		SC-70-6
Texas Instruments SN74LVC1G98YEAR	5.5 V	1.65 V	6-XFBGA DSBGA	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		6-DSBGA
Texas Instruments SN74LVC1G98DBVT	5.5 V	1.65 V	SOT-23-6	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		SOT-23-6
Texas Instruments SN74LVC1G98YZPR	5.5 V	1.65 V	6-XFBGA DSBGA	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		6-DSBGA
Texas Instruments SN74LVC1G98DSFR	5.5 V	1.65 V	6-XFDFN	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		6-SON (1x1)
Texas Instruments SN74LVC1G98DBVRG4	5.5 V	1.65 V	SOT-23-6	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		SOT-23-6
Texas Instruments SN74LVC1G98DRLR	5.5 V	1.65 V	SOT-563 SOT-666	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		SOT-5X3
Texas Instruments SN74LVC1G98YEPR	5.5 V	1.65 V	6-XFBGA DSBGA	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		6-DSBGA
Texas Instruments SN74LVC1G98DRYR	5.5 V	1.65 V	6-UFDFN	32 mA	32 mA		Surface Mount	3	Configurable Multiple Function	125 °C	-40 °C	1	Single-Ended		6-SON (1.45x1)

Catalog

Enhanced Product Configurable Multiple-Function Gate

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Supports 5-V VCCOperationInputs Accept Voltages to 5.5 VMax tpdof 6.3 ns at 3.3 VLow Power Consumption, 10-µA Max ICC±24-mA Output Drive at 3.3 VIoffSupports Partial-Power-Down Mode OperationLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Supports 5-V VCCOperationInputs Accept Voltages to 5.5 VMax tpdof 6.3 ns at 3.3 VLow Power Consumption, 10-µA Max ICC±24-mA Output Drive at 3.3 VIoffSupports Partial-Power-Down Mode OperationLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

This configurable multiple-function gate is designed for 1.65-V to 5.5-V VCCoperation. The SN74LVC1G98 device features configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter, and noninverter. All inputs can be connected to VCCor GND. This device functions as an independent gate, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT–) signals. NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. This configurable multiple-function gate is designed for 1.65-V to 5.5-V VCCoperation. The SN74LVC1G98 device features configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter, and noninverter. All inputs can be connected to VCCor GND. This device functions as an independent gate, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT–) signals. NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.