SN74LVC2G34-EP Series

Enhanced product 2-ch, 1.65-V to 5.5-V buffers

Catalog

Enhanced product 2-ch, 1.65-V to 5.5-V buffers

Part	Output Type	Mounting Type	Current - Output High, Low [y]	Current - Output High, Low [x]	Package / Case	Number of Bits per Element	Operating Temperature [Min]	Operating Temperature [Max]	Number of Elements	Logic Type	Supplier Device Package	Voltage - Supply [Max]	Voltage - Supply [Min]	Operating Temperature [Max]	Operating Temperature [Min]	Current - Output High, Low
Texas Instruments SN74LVC2G34DCKRG4	Push-Pull	Surface Mount	32 mA	32 mA	6-TSSOP SC-88 SOT-363	1	-40 °C	125 °C	2	Buffer Non-Inverting	SC-70-6	5.5 V	1.65 V
Texas Instruments SN74LVC2G34DBVRE4	Push-Pull	Surface Mount	32 mA	32 mA	SOT-23-6	1	-40 °C	125 °C	2	Buffer Non-Inverting	SOT-23-6	5.5 V	1.65 V
Texas Instruments SN74LVC2G34DRLR	Push-Pull	Surface Mount	32 mA	32 mA	SOT-563 SOT-666	1	-40 °C	125 °C	2	Buffer Non-Inverting	SOT-5X3	5.5 V	1.65 V
Texas Instruments SN74LVC2G34DBVRG4	Push-Pull	Surface Mount	32 mA	32 mA	SOT-23-6	1	-40 °C	125 °C	2	Buffer Non-Inverting	SOT-23-6	5.5 V	1.65 V
Texas Instruments SN74LVC2G34YZPR	Push-Pull	Surface Mount	32 mA	32 mA	6-XFBGA DSBGA	1	-40 °C	85 °C	2	Buffer Non-Inverting	6-DSBGA	5.5 V	1.65 V
Texas Instruments SN74LVC2G34DCK3	Push-Pull	Surface Mount	32 mA	32 mA	6-TSSOP SC-88 SOT-363	1	-40 °C	125 °C	2	Buffer Non-Inverting	SC-70-6	5.5 V	1.65 V
Texas Instruments SN74LVC2G34YEAR	Push-Pull	Surface Mount	32 mA	32 mA	6-XFBGA DSBGA	1	-40 °C	85 °C	2	Buffer Non-Inverting	6-DSBGA	5.5 V	1.65 V
Texas Instruments SN74LVC2G34DBVR	Push-Pull	Surface Mount	32 mA	32 mA	SOT-23-6	1	-40 °C	125 °C	2	Buffer Non-Inverting	SOT-23-6	5.5 V	1.65 V
Texas Instruments SN74LVC2G34DBVTG4	Push-Pull	Surface Mount	32 mA	32 mA	SOT-23-6	1	-40 °C	125 °C	2	Buffer Non-Inverting	SOT-23-6	5.5 V	1.65 V
Texas Instruments SN74LVC2G34MDCKREP	Push-Pull	Surface Mount			6-TSSOP SC-88 SOT-363	1			2	Buffer Non-Inverting	SC-70-6	5.5 V	1.65 V	125 °C	-55 °C	24 mA

Catalog

Enhanced product 2-ch, 1.65-V to 5.5-V buffers

Key Features

• Controlled BaselineOne Assembly SiteOne Test SiteOne Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Supports 5-V VCCOperationInputs Accept Voltages to 5.5 VMax tpdof 4.1 ns at 3.3 VLow-Power Consumption, 10-µA Max ICC±24-mA Output Drive at 3.3 VTypical VOLP(Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2 V at VCC= 3.3 V, TA= 25°CIoffSupports Partial-Power-Down Mode OperationLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.NanoStar, NanoFree are trademarks of Texas Instruments.Controlled BaselineOne Assembly SiteOne Test SiteOne Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Supports 5-V VCCOperationInputs Accept Voltages to 5.5 VMax tpdof 4.1 ns at 3.3 VLow-Power Consumption, 10-µA Max ICC±24-mA Output Drive at 3.3 VTypical VOLP(Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2 V at VCC= 3.3 V, TA= 25°CIoffSupports Partial-Power-Down Mode OperationLatch-Up Performance Exceeds 100 mA Per JESD 78, Class IIESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.NanoStar, NanoFree are trademarks of Texas Instruments.

Description

The SN74LVC2G34 is a dual buffer gate designed for 1.65-V to 5.5-V VCCoperation. The SN74LVC2G34 performs the Boolean function Y = A in positive logic. NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. The SN74LVC2G34 is a dual buffer gate designed for 1.65-V to 5.5-V VCCoperation. The SN74LVC2G34 performs the Boolean function Y = A in positive logic. NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.