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TOP050A09/200G H2.0-L44.3
Test and Measurement

TOP050A09/200G H2.0-L44.3

Active
Chip Shine / CSRF

ICT SPRING CONTACT TEST PROBE

Deep-Dive with AI

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TOP050A09/200G H2.0-L44.3
Test and Measurement

TOP050A09/200G H2.0-L44.3

Active
Chip Shine / CSRF

ICT SPRING CONTACT TEST PROBE

Deep-Dive with AI

Technical Specifications

Parameters and characteristics for this part

SpecificationTOP050A09/200G H2.0-L44.3
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Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyN/A 3000$ 2.00

Description

General part information

TOP050A09/200G H2.0-L44.3

ICT SPRING CONTACT TEST PROBE

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