Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops datasheet (Rev. E) | SN74BCT8374ADW - Texas Instruments

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SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops datasheet (Rev. E)